Precision Peak Determination in X-ray Powder Diffraction
نویسندگان
چکیده
منابع مشابه
X-Ray Powder Diffraction Metrics
To compare sample data from x-ray diffraction a suitable metric is developed to evaluate the similarity (or dissimilarity) between samples and to compare it to a references. The methodology focuses on the d-lines and uses the intensity measurements indirectly in the algorithm. The resulting d-line distribution and summary statistics of the differences is used to establish whether a true differe...
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ژورنال
عنوان ژورنال: Australian Journal of Physics
سال: 1988
ISSN: 0004-9506
DOI: 10.1071/ph880201